2002 · 28 citations · 1 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice ReliabilityField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsBreakdown VoltageCurrent LimitingElectrical Breakdown StrengthHigh-voltage BreakdownVoltage
We have developed highly reliable field emitter arrays with a novel vertical current limiter fabricated with a deep trench forming technology. The vertical current limiter has a local current-control function that automatically prevents fatal arc failure, and it has low resistance when used in the normal operation of a field emitter array. It has demonstrated a breakdown voltage as high as 120 V and a negligible increase in operation voltage, i.e., Vg of 70 V at 1 /spl mu/A/tip with an emitter cone density of more than 5/spl times/10/sup 7/ emitters/cm/sup 2/.
1
'Microtips' fluorescent display
P. Vaudaine, Robert G. Meyer · 2002 · 39 citations
Natural Sciences, Electrical Engineering, Materials Science +9