Microscopy Today · 2016 · 37 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceElectrochemical EngineeringElectrochemistryNanotechnologyAtomic Force MicroscopyElectroanalytical ChemistryElectrochemical SensorsElectrode MaterialsNanomaterial CharacterizationScanning Probe MicroscopyElectrode Surface EngineeringHigh-resolution Surface ImagingMicroscopyMicroscopy ImagingNanostructured Electrode MaterialsNanostructured ElectrodesScanning Electrochemical MicroscopyTopographic Imaging
This article describes new batch-fabricated, robust, and easyto-use scanning electrochemical microscopy (SECM) nanoelectrode probes with a characteristic dimension of about 50 nm. The resulting microscopy method, PeakForce SECM, provides electrochemical images with sub-100-nm resolution, as well as simultaneously acquired topographical, electrical, and mechanical maps on the nanometerscale. Using Bruker's existing high-bandwidth electronics, PeakForce SECM also provides the capability for high-quality nanoelectrical imaging in liquid. This article describes several applications of this new PeakForce SECM capability that enable various types of multidisciplinary research.
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Yikai Chen, Ke Sun, Heather A. Audesirk et al. · Energy & Environmental Science · 2015 · 73 citations · Full text
Natural Sciences, Chemical Engineering, Materials Science +17