PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes

Zhuangqun Huang, Peter Wolf, Rakesh Poddar, Chunzeng Li, Andreas Mark, Michael R. Nellist, Yikai Chen, Jingjing Jiang, Georg Papastavrou, Shannon W. Boettcher,

Microscopy Today · 2016 · 37 citations · 6 references

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Abstract

This article describes new batch-fabricated, robust, and easyto-use scanning electrochemical microscopy (SECM) nanoelectrode probes with a characteristic dimension of about 50 nm. The resulting microscopy method, PeakForce SECM, provides electrochemical images with sub-100-nm resolution, as well as simultaneously acquired topographical, electrical, and mechanical maps on the nanometerscale. Using Bruker's existing high-bandwidth electronics, PeakForce SECM also provides the capability for high-quality nanoelectrical imaging in liquid. This article describes several applications of this new PeakForce SECM capability that enable various types of multidisciplinary research.

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