Topographic Imaging

Topographic Imaging is a measurement methodology in scanning probe microscopy that belongs to the class of imaging techniques and is differentiated by its capacity to map the physical surface morphology of a sample at nanoscale resolution through the precise spatial detection of probe-sample interactions.

387

Publications

18K

Citations

1.5K

Authors

516

Institutions

Publications per year

2017–2026

56

Authors

1.5K

  1. YT
    Yasufumi Takahashi

    Tohoku University, Japan

    7 publications · 565 citations

    7

    h-index

  2. DK
    David Klenerman

    University of Cambridge, United Kingdom

    6 publications · 404 citations

    6

    h-index

  3. YE
    Yuri E. Korchev

    Imperial College London, United Kingdom

    6 publications · 389 citations

    6

    h-index

  4. AS
    Andrew Shevchuk

    Imperial College London, United Kingdom

    5 publications · 349 citations

    5

    h-index

  5. PH
    Peter Hinterdorfer

    Johannes Kepler University of Linz, Austria

    5 publications · 611 citations

    5

    h-index

1–5 of 1.5K

Venues

  1. Applied Physics Letters

    22 publications · 1.2K citations

    17

    h-index

  2. Analytical Chemistry

    16 publications · 921 citations

    15

    h-index

  3. 11

    h-index

  4. Review of Scientific Instruments

    11 publications · 315 citations

    11

    h-index

  5. 10

    h-index

1–5