Accelerated life testing of nano ceramic capacitors and capacitor test boards using non-parametric method

Applied Life Data Analysis.

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High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Yves Ousten et al. · Microelectronics Reliability · 2002 · 40 citations

Natural Sciences, Electrical Engineering, Materials Science +14

Highly accelerated lifetesting of base-metal-electrode ceramic chip capacitors

Jonathan L. Paulsen, Erik K. Reed · Microelectronics Reliability · 2002 · 31 citations

Engineering, Electrical Engineering, Materials Science +14

Failure analysis and redesign of a helix upper dispenser

Seongwoo Woo, Michael Pecht · Engineering Failure Analysis · 2007 · 28 citations

Engineering, Design, Actuators +5

Reliability evaluation for the pump assembly using an accelerated test

Sangjun Park, Sang-Deuk Park, Sang-Deuk Park et al. · International Journal of Pressure Vessels and Piping · 2006 · 26 citations

Engineering, Manufacturing Engineering, Hydraulics +15