Yves Ousten

Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform

L. Angrisani, Laurent Béchou, Dominique Dallet et al. · Measurement · 2002 · 45 citations

Electronic Devices, Engineering, Crystalline Defects +11

High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Yves Ousten et al. · Microelectronics Reliability · 2002 · 40 citations

Reliability, Materials Science, Electrical Engineering +8

Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses

Raphaël Baillot, Yannick Deshayes, Laurent Béchou et al. · Microelectronics Reliability · 2010 · 21 citations

Electrical Engineering, Solid-state Lighting, Engineering +5

Vibration lifetime modelling of PCB assemblies using steinberg model

A. Dehbi, Yves Ousten, Y. Danto et al. · Microelectronics Reliability · 2005 · 19 citations

Engineering, Mechanics, Mechanical Engineering +7

Ultrasonic images interpretation improvement for microassembling technologies characterisation

Laurent Béchou, Yves Ousten, Bernard Trégon et al. · Microelectronics Reliability · 1997 · 17 citations

Engineering, Microfabrication, Mechanical Engineering +5