Concepedia

High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Yves Ousten, Y. Danto

Microelectronics Reliability · 2002 · 40 citations · 0 references

Concepts

Natural SciencesElectrical EngineeringMaterials ScienceElectrochemistryElectronic MaterialsPower ElectronicsCorrosion TestingDevice ReliabilityElectrode MaterialsReliabilityReliability AssuranceTest ReliabilityCapacitorsElectrolytic CapacitorsHigh-temperature TestingReliability TestingThermal Reliability