Y. Danto

High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Yves Ousten et al. · Microelectronics Reliability · 2002 · 40 citations

Natural Sciences, Electrical Engineering, Materials Science +14

Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests

Yannick Deshayes, Laurent Béchou, François Verdier et al. · Quality and Reliability Engineering International · 2005 · 35 citations

Engineering, Electrical Engineering, Materials Science +17

Ultrasonic images interpretation improvement for microassembling technologies characterisation

Laurent Béchou, Yves Ousten, Bernard Trégon et al. · Microelectronics Reliability · 1997 · 17 citations

Engineering, Manufacturing Engineering, Materials Engineering +14

NON-DESTRUCTIVE DETECTION AND LOCALIZATION OF DEFECTS IN MULTILAYER CERAMIC CHIP CAPACITORS USING ELECTROMECHANICAL RESONANCES

Laurent Béchou, S. Mejdi, Yves Ousten et al. · Quality and Reliability Engineering International · 1996 · 14 citations · Full text

Natural Sciences, Electrical Engineering, Materials Science +17

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy

Laurent Béchou, Dominique Dallet, Y. Danto et al. · IEEE Transactions on Instrumentation and Measurement · 2003 · 14 citations

Natural Sciences, Electrical Engineering, Acoustics +16