ECS Meeting Abstracts · 2006 · 10 citations · 0 references
EngineeringElectrical EngineeringPhysicsCondensed Matter PhysicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingDevice SimulationElectronic Transport ModelingSemiconductor InterfacesSemiconductor PhysicsSemiconductor ReliabilityBias Temperature InstabilityGate Oxide InterfacesGate OxidesHot Carrier DynamicsNegative Bias Temperature Instability
Abstract not Available.