Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA

Concepts

EngineeringComputer EngineeringPhysicsFault ToleranceFault-tolerant ComputingReconfigurable ComputingBuilt-in Self-testFpga ArchitectureHardware Fault ToleranceEvent Response AnalysisRadiation Hardened Computer ArchitectureRadiation-hardened MicroprocessorsRadiation-hardened System ArchitectureSingle Event EffectsSingle Event Upset ModelingThermal Neutron ScatteringThermal Neutron Spectra

Abstract

The single-event response of Xilinx 20nm UltraScale Kintex FPGA is characterized using neutron, 64 MeV proton, thermal neutron and alpha foil irradiation sources. Single-event upset and multi-bits upset results are presented.

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