AC and DC ELECTROMIGRATION IN ALUMINUM CONTACT JUNCTIONS 11.4

Abstract

Results are presented for experiments in which aluminum model contact asperity junctions are operated at current density up to IO6 A/cmZ with either DC or AC square wave current. Application of current as a square wave eliminates the possible influence of cyclic thermal stresses which could have been a factor in a previous study. Electromigration failure, observed as a relatively abrupt increase of resistance, occurs in both AC and DC specimens. Condit.ions under which electromigration deterioration may occur in practical aluminum power connections are discussed. Keywords: Aluminum Contacts, Aluminum Connections, Electromigration, A.Luminum Contact Failure, Qualification Testing.