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Performance of Ge-on-Si p-i-n Photodetectors for Standard Receiver Modules
80
Citations
7
References
2006
Year
Semiconductor TechnologyPhotonicsElectrical EngineeringEngineeringApplied PhysicsAvailable Gaas DevicesOptoelectronic DevicesIntegrated CircuitsStandard Receiver ModulesDark Current DensityGe DetectorsMicroelectronicsPhotonic Integrated CircuitOptoelectronicsPhotoelectric MeasurementImage SensorSemiconductor Device
Ge on Si p-i-n photodetectors with areas which are compatible with commercially available receivers have been fabricated and tested. A dark current density of 6 mA/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> at -1-V bias has been measured at room temperature; when heated to 85 degC, the measured dark current increases by a factor of nine. A responsivity of 0.59 A/W at 850 nm has been measured from these Ge detectors, which matches or exceeds commercially available GaAs devices. We have measured bandwidths approaching 9 GHz at -2-V bias from 50-mum diameter Ge detectors, and have observed eye diagrams comparable to those obtained from GaAs-based receivers at 4.25 Gb/s
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