Electronics Letters · 1977 · 30 citations · 5 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice ModelingDevice SimulationElectron TransportElectronic Transport ModelingSemiconductor PhysicsCarrier Drift VelocityCarrier Transport In SemiconductorsCarrier Transport MechanismsCharge Carrier Drift VelocityElectron Transport In SemiconductorsImpurity TransportTransit Time DistributionTransport In Semiconductors
The effect of ionised impurity scattering on the transient drift velocity of electrons in short-gate GaAs and InP field-effect transistors is investigated by Monte Carlo techniques.
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