Journal of Physics D Applied Physics · 1978 · 401 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceElectrochemistryInterface ScienceSemiconductor MaterialsMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsCapacitanceCapacitance-voltage CharacteristicsCapacitance-voltage MeasurementsSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky BarriersSchottky ContactsSemiconductor-electrolyte Interfaces
Possible sources of deviations of semiconductor/metal and semiconductor/electrolyte Schottky barriers from ideality are discussed. The conditions under which the flat-band potential of the barrier can be determined by capacitance measurements are deduced. Results on the flat-band potential and the position of the band edges for several semiconductor/electrolyte barriers are given.
11
E. C. Dutoit, R.L. Van Meirhaeghe, F. Cardon et al. · Berichte der Bunsengesellschaft für physikalische Chemie · 1975 · 152 citations
Natural Sciences, Electrical Engineering, Materials Science +17