IEEE Photonics Technology Letters · 2004 · 33 citations · 7 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsWell IntegrityDevice ReliabilityLaser DiodesPhotonic Integrated CircuitsQuantum Well DevicesSemiconductor LasersSemiconductor ReliabilityHigh-power Laser DiodesIntegrated LasersIntegrated Semiconductor LasersLong-term Device ReliabilityPower OutputQuantum Well Laser DiodesQuantum Well LasersReliability Tests
We report on highly reliable, high-power, and high-performance 980-nm quantum-well laser chips and modules. Ridge waveguide laser diode chips with 750-mW output power and 500-mW fiber Bragg grating stabilized modules have been achieved and Telcordia-qualified. Long-term reliability tests show a very low failure rate of 400 FIT (failures in time) at 900-mA operating current or 500-mW module power. The kink-free fiber coupled module output power can be as high as 640 mW with grating stabilization, which produces very good wavelength stability and power stability. A further improved structure shows a record continuous-wave rollover chip power of 1.6 W for the 5-μm-wide ridge waveguide laser diodes.
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High-power operation of strained InGaAs/AlGaAs single quantum well lasers
A. Moser, A. Oosenbrug, E.E. Latta et al. · Applied Physics Letters · 1991 · 67 citations