Concepedia

Minimal March Tests for Unlinked Static Faults in Random Access Memories

G. Harutunyan, V.A. Vardanian, Y. Zorian

2005 · 63 citations · 6 references

Abstract

New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).

References

6

Testing semiconductor memories, theory and practice

John Niven · Microprocessors and Microsystems · 1992 · 514 citations

Electrical Engineering, Engineering, Mem Testing +7

March SS: a test for all static simple RAM faults

Said Hamdioui, A.J. van de Goor, M. Rodgers · 2003 · 132 citations

Engineering, Mem Testing, Computer Architecture +19

March tests for word-oriented memories

A.J. van de Goor, I.B.S. Tlili · Proceedings Design, Automation and Test in Europe · 2002 · 72 citations

Engineering, Fault Models, Neurolinguistics +26

Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results

Said Hamdioui, Zaid Al-Ars, A.J. van de Goor et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 61 citations

Engineering, Fault Models, Mem Testing +22

Simulation-based test algorithm generation for random access memories

Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng et al. · 2002 · 49 citations

Engineering, Mem Testing, Computer Architecture +17