Memory March Testing

Memory March Testing is a Built-In Self-Test method that systematically verifies memory functionality by applying a sequence of controlled read and write operations across memory locations in a marching pattern to detect structural faults such as stuck-at, transition, and coupling defects.

Publications

2.7K

Citations

116

Authors

Institutions

Publications per year

2017–2026

Variants

March Testing

Parents

Built-in Self-test

Publications

Using march tests to test SRAMs

A.J. van de Goor · IEEE Design & Test of Computers · 1993 · 271 citations

Engineering, Computer Engineering, Electrical Engineering +16

A March Test for Functional Faults in Semiconductor Random Access Memories

Suk Suk, Reddy · IEEE Transactions on Computers · 1981 · 194 citations

Engineering, Computer Engineering, Computer Science +11

An experimental analysis of spot defects in SRAMs: realistic fault models and tests

Said Hamdioui, A.J. van de Goor · 2002 · 139 citations

Engineering, Computer Engineering, Electrical Engineering +17

March SS: a test for all static simple RAM faults

Said Hamdioui, A.J. van de Goor, M. Rodgers · 2003 · 134 citations

Engineering, Computer Engineering, Computer Science +15

Fault modeling and testing of 1T1R memristor memories

Yong-Xiao Chen, Jin-Fu Li · 2015 · 75 citations

Engineering, Computer Engineering, Electrical Engineering +15

1–5 of 75

Authors

116

AV
A.J. van de Goor
Delft University of Technology, Netherlands
19 publications · 1.1K citations
15
h-index
PG
Patrick Girard
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
8 publications · 286 citations
8
h-index
AV
A. Virazel
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
8 publications · 286 citations
8
h-index
SP
S. Pravossoudovitch
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
7 publications · 270 citations
7
h-index
LD
Luigi Dilillo
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
6 publications · 254 citations
6
h-index

1–5 of 116

Institutions

1–8 of 51

Venues

IEEE Transactions on Computers
6 publications · 309 citations
6
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
4 publications · 81 citations
3
h-index
Journal of Electronic Testing
JETTA · 3 publications · 86 citations
3
h-index
International Journal of Applied Mathematics and Computer Science
2 publications · 31 citations
2
h-index
International Journal of Electrical and Computer Engineering (IJECE)
1 publications · 20 citations
1
h-index

1–5