Publication | Closed Access
Determination of junction temperature in AlGaAs/GaAs heterojunction bipolar transistors by electrical measurement
67
Citations
6
References
1992
Year
SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineeringWide-bandgap SemiconductorApplied PhysicsThermal ResistanceThermal PropertyElectrical MeasurementThermodynamicsJunction TemperatureThermal EngineeringDc GainSemiconductor Device
A method of measuring the junction temperature and associated thermal resistance of heterojunction bipolar transistors by using the temperature dependence of the DC gain is described.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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