J. R. Waldrop

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical Review Letters · 1980 · 1.4K citations

X-ray Spectroscopy, Engineering, X-ray Photoemission Spectra +17

Polar heterojunction interfaces

Walter A. Harrison, E. A. Kraut, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1978 · 627 citations

Electrical Engineering, Polariton Dynamic, Engineering +14

Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1983 · 497 citations

Wide-bandgap Semiconductor, Engineering, Xps Data +16

Colorwave: an anticollision algorithm for the reader collision problem

J. R. Waldrop, Daniel W. Engels, Sanjay E. Sarma · 2004 · 305 citations

Numerical Analysis, Rfid Readers, Anticollision Algorithm +14

Measurement of AlN/GaN (0001) heterojunction band offsets by x-ray photoemission spectroscopy

J. R. Waldrop, R. W. Grant · Applied Physics Letters · 1996 · 254 citations

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +14