J. R. Waldrop

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Publications

Citations

6.8K

H-Index

Active since

1971

Affiliations

Rockwell Automation (United States)(Current)

J. R. Waldrop is an author at Rockwell Automation (United States) specializing in materials science, semiconductor materials, and semiconductor interfaces.

Publications per year

1971–2005

Publications

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical Review Letters · 1980 · 1.5K citations

Natural Sciences, Materials Engineering, Materials Science +17

Polar heterojunction interfaces

Walter A. Harrison, E. A. Kraut, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1978 · 628 citations

Natural Sciences, Materials Engineering, Materials Science +17

Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1983 · 503 citations

Natural Sciences, Materials Science, Physics +17

Colorwave: an anticollision algorithm for the reader collision problem

J. R. Waldrop, Daniel W. Engels, Sanjay E. Sarma · 2004 · 305 citations

Engineering, Computer Science, Systems Engineering +16

Measurement of AlN/GaN (0001) heterojunction band offsets by x-ray photoemission spectroscopy

J. R. Waldrop, R. W. Grant · Applied Physics Letters · 1996 · 257 citations

Natural Sciences, Materials Engineering, Materials Science +17

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