Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

Abstract

A highly precise method for locating the valence-band edge in x-ray photoemission spectra is reported. The application to measuring semiconductor interface potentials is discussed. X-ray photoemission-spectroscopy experiments on Ge and GaAs(110) crystals have given Ge $3d$, Ga $3d$, and As $3d$ core level to valence-band edge binding-energy differences of 29.55, 18.81, and 40.73 eV to a precision of \ifmmode\pm\else\textpm\fi{}0.02 eV. For illustration, the valence-band discontinuity at an abrupt Ge/GaAs(110) heterojunction is determined to be 0.53\ifmmode\pm\else\textpm\fi{}0.03 eV.