E. A. Kraut

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical Review Letters · 1980 · 1.4K citations

X-ray Spectroscopy, Engineering, X-ray Photoemission Spectra +17

Polar heterojunction interfaces

Walter A. Harrison, E. A. Kraut, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1978 · 627 citations

Electrical Engineering, Polariton Dynamic, Engineering +14

Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1983 · 497 citations

Wide-bandgap Semiconductor, Engineering, Xps Data +16

CdTe-HgTe (¯1¯1¯1) Heterojunction Valence-Band Discontinuity: A Common-Anion-Rule Contradiction

Steven P. Kowalczyk, J. T. Cheung, E. A. Kraut et al. · Physical Review Letters · 1986 · 215 citations

Semiconductors, Ii-vi Semiconductor, Engineering +13

New Melting Law at High Pressures

E. A. Kraut, George C. Kennedy · Physical Review · 1966 · 188 citations

Sodium Chloride, Engineering, Earth Science +16