S. P. Kowalczyk

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical Review Letters · 1980 · 1.5K citations

Natural Sciences, Materials Engineering, Materials Science +17

Total valence-band densities of states of III-V and II-VI compounds from x-ray photoemission spectroscopy

L. Ley, R. A. Pollak, F. R. McFeely et al. · Physical review. B, Solid state · 1974 · 840 citations

Natural Sciences, Materials Science, Physics +17

X-ray photoemission studies of diamond, graphite, and glassy carbon valence bands

F. R. McFeely, S. P. Kowalczyk, L. Ley et al. · Physical review. B, Solid state · 1974 · 550 citations · Full text

Natural Sciences, Materials Science, Electronic Materials +14

Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy

E. A. Kraut, R. W. Grant, J. R. Waldrop et al. · Physical review. B, Condensed matter · 1983 · 503 citations

Natural Sciences, Materials Science, Physics +17

X-Ray Photoemission Spectra of Crystalline and Amorphous Si and Ge Valence Bands

L. Ley, S. P. Kowalczyk, R. A. Pollak et al. · Physical Review Letters · 1972 · 367 citations · Full text

Natural Sciences, Materials Science, Physics +17