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Large area, ultra-high voltage 4H-SiC p-i-n rectifiers
69
Citations
10
References
2002
Year
Large AreaElectrical EngineeringHigh Temperature CharacteristicsSi RectifiersHigh Voltage EngineeringEngineeringNanoelectronicsPower DeviceApplied PhysicsPower Semiconductor DevicePower ElectronicsMicroelectronicsJunction Termination ExtensionSemiconductor Device
This paper reports the design, fabrication and high temperature characteristics of 1 mm/sup 2/, 4 mm/sup 2/ and 9 mm/sup 2/ 4H-SiC p-i-n rectifiers with 6 kV, 5 kV, and 10 kV blocking voltage, respectively. These results were obtained from two lots in an effort to increase the total power levels on such rectifiers. An innovative design utilizing a highly doped p-type epitaxial anode layer and junction termination extension (JTE) were used in order to realize good on-state as well as stable blocking characteristics. For the 1 mm/sup 2/ and 4 mm/sup 2/ rectifier, a forward voltage drop of less than 5 V was observed at 500 A/cm/sup 2/ and the peak reverse recovery current shows a modest 50% increase in the 25/spl deg/C to 225/spl deg/C temperature range. On the 10 kV, 9 mm/sup 2/ rectifier, a forward voltage drop of less than 4.8 V was observed at 100 A/cm/sup 2/ in the entire 25/spl deg/C to 200/spl deg/C temperature range. For this device, the reverse recovery characteristics show a modest 110% increase in the peak reverse recovery current from 25/spl deg/C to 200/spl deg/C. A dramatically low Q/sub rr/ of 3.8 /spl mu/C was obtained at a forward current density of 220 A/cm/sup 2/ at 200/spl deg/C for this ultra high voltage rectifier. These devices show that more than three orders of magnitude reduction in reverse recovery charge is obtained in 4H-SiC rectifiers as compared to comparable Si rectifiers.
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