A scalable, statistical SPICE Gummel-Poon model for SiGe HBTs

Abstract

A scaleable, statistical model has been developed for SiGe HBTs. SPICE Gummel-Poon model parameters are scaled, and statistics added, using language features built into HSPICE. DC and AC fit is good over a wide range in emitter sizes. Features of IBM's HBT technology which make scaling work are discussed.