A scalable, statistical SPICE Gummel-Poon model for SiGe HBTs

K. Walter, B. Ebersman, D.A. Sunderland, G.D. Berg, G. Freeman, R. Groves, D.K. Jadus, D.L. Harame

2002 · 12 citations · 5 references

Concepts

Abstract

A scaleable, statistical model has been developed for SiGe HBTs. SPICE Gummel-Poon model parameters are scaled, and statistics added, using language features built into HSPICE. DC and AC fit is good over a wide range in emitter sizes. Features of IBM's HBT technology which make scaling work are discussed.

References

5