Journal of Physics D Applied Physics · 2014 · 22 citations · 44 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistryOptical MaterialsThin FilmsInorganic SpectroscopyMetal OxidesOptical Thin FilmsOxide SemiconductorsThin Film Electrical PropertiesThin Film Optical PropertiesEllipsometryOptical PropertiesOptical Thin Film CharacterizationSpectroscopic EllipsometryThin Oxide FilmsThin Oxide LayersVisible SpectroscopyX-ray Diffraction Analysis
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations
Wang‐Jae Chun, Akio Ishikawa, H. Fujisawa et al. · The Journal of Physical Chemistry B · 2003 · 1K citations