Concepedia

Prediction and verification of process induced warpage of electronic packages

W.D. van Driel, G. Q. Zhang, J.H.J. Janssen, L.J. Ernst, Fei Su, K. S. Chian, Shujuan Yi

Microelectronics Reliability · 2003 · 56 citations · 2 references

DOI

Concepts

References

2

An interpretation of Moiré interferometry from wavefront interference theory

Fulong Dai, James McKelvie, Daniel Post · Optics and Lasers in Engineering · 1990 · 46 citations

, , +11

Diffraction theory of optical interference moiré and a device for production of variable virtual reference gratings: A moiré microscope

T. W. Shield, K. S. Kim · Experimental Mechanics · 1991 · 30 citations

, , +16