2005 · 14 citations · 2 references
EngineeringComputer EngineeringComputer ScienceEmbedded SystemsFault-tolerant SystemsSystems AnalysisDesign For TestabilityDiagnosisDiagnosticsFault DetectionFault DiagnosisOn-board DiagnosticsBoundary ScanBoundary Scan ArchitectureBoundary Scan TestingDiagnostic Test DesignHardware DiagnosticsOn-board Diagnostic TestingSystem DiagnosticsSystem Testing
This paper proposes a framework for testing and diagnosing in-sys,tem, IEEE Std 1149.1 compliant boards. It defines the mechanisms used to describe, store, execute the tests, perform diagnosis, and the interface to the system diagnostician. Using, BIST and Boundary-Scan in-system makes it possible to achieve high test quality, comparable to that achieved during board test. Diagnostic accuracy and resolution can also be enhanced.
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Achieving Board-Level BIST Using the Boundary-Scan Master
N. Jarwala, C.W. Yau · 2005 · 34 citations