Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks - Concepedia

Concepedia

Publication | Closed Access

Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

15

Citations

16

References

2009

Year

E. Miranda, J. Martín-Martínez, Eileen O’Connor, G. Hughes, P. Casey, K. Cherkaoui, Scott Monaghan, R. D. Long, Dan O’Connell, Paul K. Hurley

Microelectronics Reliability

Electrical EngineeringEngineeringMetal Gate/mgo/inp StacksStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsElectrical StressTime-dependent Dielectric BreakdownConduction CharacteristicsElectronic PackagingMicroelectronicsElectrical Insulation

References

	Year	Citations

Page 1

Page 1