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A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets
10
Citations
4
References
2005
Year
Unknown Venue
Physical origin of negative differential resistance in SOI transistors
Liam McDaid, Steven Hall, Phil Mellor, +2
Electronics Letters
1989
118
Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs
R.J.T. Bunyan, Michael J. Uren, J. Alderman, +1
IEEE Electron Device Letters
EngineeringNoise ThermometryIntegrated CircuitsSilicon On InsulatorSemiconductor Device +17
1992
43
Electrical transient study of negative resistance in SOI MOS transistors
Olivier Le Neel, M. Haond
Device ModelingElectrical EngineeringEngineeringElectrical Transient StudyPhysics +10
1990
40
Thermal time constants in SOI-MOSFETs
M. Berger, G. Burbach
Electrical EngineeringDetailed Theoretical ConsiderationsEngineeringPhysicsSelf Heating +13
1991
14
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