IEEE Transactions on Plasma Science · 2000 · 84 citations · 3 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingDevice ReliabilityP-n JunctionsSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor ReliabilityCurrent DensityJunction BreakdownRise TimeSwitching BehaviorSwitching DevicesSwitching PerformanceVoltage Interruption
The physical basis for semiconductor nanosecond opening switches is a specially organized recovery process in the diode. There are two modes of this process: junction recovery (JR) mode and silicon opening switch (SOS) mode. In the JR mode, the current interruption occurs due to the recovery of pn-junction blocking capability, and in the SOS mode, due to the drastic increase in resistance of low-doped part of p-layer, where reverse current density exceeds the saturated value j/sub r/>qN/sub d/V/sub s/. JR mode is preferable for generators with a pulse rise-time of 0.5-3 ns and a pulse of power of less than 50-80 MW, and SOS mode at pulse rise-time of more than 5 ns for any pulse power and at any pulse rise-time if power is higher than 100 MW.
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Power drift step recovery diodes (DSRD)
I. V. Grekhov, V.M. Efanov, A.F. Kardo-Sysoev et al. · Solid-State Electronics · 1985 · 123 citations
Powerful semiconductor 80 kV nanosecond pulser
V.M. Efanov, A.F. Kardo-Sysoev, Mikhail Larionov et al. · 2002 · 19 citations