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Publication | Open Access

Monte Carlo analysis of the dynamic behavior of III–V MOSFETs for low-noise RF applications

DOIFull Paper Access

12

Citations

36

References

2013

Year

Ming Shi, Jérôme Saint-Martin, Arnaud Bournel, Damien Querlioz, Nicolas Wichmann, S. Bollaert, F. Danneville, Philippe Dollfus
Solid-State Electronics

References

YearCitations

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