Ming Shi

In depth characterization of electron transport in 14 nm FD-SOI CMOS devices

Minju Shin, Ming Shi, Mireille Mouis et al. · Solid-State Electronics · 2015 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +16

Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions

Minju Shin, Ming Shi, Mireille Mouis et al. · Solid-State Electronics · 2015 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +13

Source/drain induced defects in advanced MOSFETs: what device electrical characterization tells

Mireille Mouis, Jae Wook Lee, Dae‐Young Jeon et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2013 · 13 citations

Engineering, Electrical Engineering, Materials Science +15

Full split C–V method for parameter extraction in ultra thin BOX FDSOI MOS devices

Minju Shin, Ming Shi, Mireille Mouis et al. · Solid-State Electronics · 2014 · 13 citations

Engineering, Electrical Engineering, Materials Science +12

Experimental and Theoretical Investigation of Magnetoresistance From Linear Regime to Saturation in 14-nm FD-SOI MOS Devices

Minju Shin, Ming Shi, Mireille Mouis et al. · IEEE Transactions on Electron Devices · 2014 · 13 citations

Engineering, Electrical Engineering, Microelectronics +16