Journal of Applied Physics · 2004 · 113 citations · 16 references
EngineeringMicromechanicsMicroscopyMechanical EngineeringPiezoresponse Force MicroscopyFerroelectric ApplicationMechanicsPiezoelectric MaterialMaterials SciencePiezoelectric MaterialsPiezoelectricityBatio3 Bulk MaterialC DomainsSpherical TipFerroelasticsMicrofabricationScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyFerroelectric MaterialsThin FilmsFunctional MaterialsSurface DisplacementsMechanics Of Materials
Piezoresponse force microscopy (PFM) is applied to image ferroelastic formed c domains in a single crystal ferroelectric barium titanate bulk material. A simple model and an analytical approach are presented, which provides a basis to understand the complex tip-surface interactions responsible for the image contrast in PFM. In particular, the measured amplitude of the piezoresponse out-of-plane surface displacements of a C− domain is compared with theoretical results based upon a three-dimensional Green’s function solution. The electric field distribution in the tip-surface contact is determined using image-charge calculations for a spherical tip separated by a thin water layer from a mechanically isotropic and electrically anisotropic dielectric half plane.
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Classical Electrodynamics (2nd edn)
M. G. Brereton · Physics Bulletin · 1976 · 2.4K citations