IEEE Transactions on Electron Devices · 1966 · 31 citations · 8 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsElectrical ConductivityHigh-frequency Semiconductor DevicesMicrowave Semiconductor DevicesSemiconductor DefectsSemiconductor PhysicsWide Band Gap SemiconductorsCharge InjectionConduction BandElectrical BreakdownElectron DensityElectron Impact IonizationIonizationMicrowave DevicesSpace-charge-limited Current
It has been found that Gunn-effect oscillations in high-resistivity GaAs cease when the product of the conduction electron density and the sample length drops below 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">11</sup> cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> as predicted by theory. The samples investigated exhibited impact ionization of a deep donor level lying 0.41 eV below the conduction band edge when subjected to an applied electric field equal to the Gunn-effect threshold field. Some observations concerning space-charge limited injection of electrons and concerning electrical breakdown in high-resistivity GaAs are also reported.
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Micheál Jacob · Health Education Journal · 1989 · 3.1K citations · Full text
H. Kroemer · Proceedings of the IEEE · 1964 · 216 citations
Properties of elemental and compound semiconductors
Journal of the Franklin Institute · 1960 · 151 citations