Charge Injection

Charge Injection is a process in semiconductor physics whereby charge carriers are introduced from an electrode into the conduction or valence band of a semiconductor material, distinguishing it from other charge transport mechanisms by its dependence on interfacial energy barriers and injection efficiency at the electrode–semiconductor junction.

2.8K

Publications

175.2K

Citations

10.4K

Authors

1.8K

Institutions

Publications per year

2017–2026

820

Authors

10.4K

  1. PV
    Prashant V. Kamat

    University of Notre Dame, United States

    23 publications · 2.8K citations

    22

    h-index

  2. YN
    Yong‐Young Noh

    Dongguk University, South Korea

    22 publications · 1.4K citations

    18

    h-index

  3. SF
    Stuart F. Cogan

    EIC Laboratories, United States

    18 publications · 1.2K citations

    16

    h-index

  4. MG
    Michaël Grätzel

    École Polytechnique Fédérale de Lausanne, Switzerland

    16 publications · 3.7K citations

    16

    h-index

  5. RH
    Richard H. Friend

    University of Cambridge, United Kingdom

    14 publications · 1.9K citations

    14

    h-index

1–5 of 10.4K

Venues

  1. Applied Physics Letters

    247 publications · 13.6K citations

    66

    h-index

  2. Journal of Applied Physics

    198 publications · 12.8K citations

    62

    h-index

  3. ACS Applied Materials & Interfaces

    100 publications · 5.1K citations

    46

    h-index

  4. Advanced Functional Materials

    82 publications · 6.4K citations

    44

    h-index

  5. Advanced Materials

    63 publications · 7.3K citations

    43

    h-index

1–5