Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor / System-on-a-Chip

Carl M. Szabo, Adam R. Duncan, Kenneth A. LaBel, Matt Kay, Pat Bruner, Mike Krzesniak, Lei Dong

2015 · 13 citations · 0 references

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Abstract

Hardness assurance test results of Intel state-of-the-art 14nm "Broadwell" U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method builds upon previous efforts by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).