Publication | Closed Access
Smart-substrate multichip-module systems
24
Citations
8
References
1994
Year
EngineeringDevice IntegrationVerificationComputer ArchitectureSystem-level DesignEmbedded SystemsHardware SystemsAdvanced Packaging (Semiconductors)Systems EngineeringIncremental TestElectronic PackagingTest BenchImplementation StrategyElectrical EngineeringSystem TestingSmart-substrate Multichip-module SystemsComputer EngineeringComputer ScienceDesign For TestingChip-scale PackageHardware EmulationMicrofabricationSoftware TestingTest LogicAutomated Test EquipmentDesign For TestabilitySystem Software
This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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