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The Roles of Ions and Neutral Active Species in Microwave Plasma Etching
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1979
Year
Electrical EngineeringEngineeringPhysicsMicrofabricationMicrowave PlasmaPlasma ApplicationApplied PhysicsNeutral Active SpeciesMixture DischargeInstrumentationGas Discharge PlasmaMicroelectronicsPlasma EtchingIon EmissionMicrowave Plasma Etching
The roles of ions and neutral active species in microwave plasma etching are investigated. Silicon wafers are etched in a mixture discharge. The results of three different experiments agree and are suggestive of the following: Si wafers can be etched only when ions impinge on the wafer surface at pressures lower than 0.13 Pa , Si wafers are etched by neutral active species at pressures higher than 1.3 Pa , and both by ions and neutral active species at pressures between 0.13 Pa and 1.3 Pa .