2006 · 28 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringAgingMicroelectronicsSemiconductor DevicesBuilt-in Self-testDevice CharacterizationDevice ReliabilityOn-board DiagnosticsPrognostic AssessmentSemiconductor ReliabilityAging CharacterizationAging Degradation AnalysisDegradation MonitoringDielectric BreakdownFault PrognosticsPrognosticsReliability Degradation MechanismsTime-dependent Dielectric Breakdown
A prognostic cell to monitor time-dependent dielectric breakdown and electronic aging of integrated circuits has been designed and fabricated.
3
Time dependent breakdown of ultrathin gate oxide
A. Yassine, H.E. Nariman, Michael J. McBride et al. · IEEE Transactions on Electron Devices · 2000 · 62 citations