2002 · 86 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice CharacterizationDevice ModelingSemiconductor Device MaterialsSemiconductor PhysicsCarrier DiffusionCarrier DriftCurrent-voltage CharacterizationCurrent-voltage RelationsDiode Current-voltage CharacteristicsInfrared Absorption SpectroscopyTemperature DependenceTemperature Dependence Of Diodes
In this paper it is shown experimentally how the shape and the amount of the carrier distribution in the middle region of a diode influences the static behavior (voltage-current characteristic), the dynamic behavior (reverse recovery current, reverse recovery charge, soft recovery) and the temperature dependence of these characteristics. By combining the lifetime dominated Hall-principle and the emitter-controlling Kleinmann-principle various diodes were manufactured and investigated. With an infrared absorption technique the corresponding carrier distributions were measured.
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High-speed low-loss p-n diode having a channel structure
Y. Shimizu, M. Naito, S. Murakami et al. · IEEE Transactions on Electron Devices · 1984 · 42 citations