IEEE Journal of Solid-State Circuits · 2010 · 20 citations · 15 references
EngineeringComputer EngineeringElectrical EngineeringLow-power DesignMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyIntegrated Circuit DesignMixed-signal IntegrationOptical Communication SystemsPhotonic Integrated CircuitsBicmos TechnologyOptical TransceiversPower ConsumptionPower Consumption OptimizationSerdes ArchitectureSige Bicmos DesignTestabilityTestability Engineering
A Dual-mode 2 ×21.5-22.3 Gb/s DQPSK or 1 × 39.8-44.6 Gb/s NRZ to 4 × 9.95-11.2 Gb/s SFI5.2-compliant two-chip SerDes for a family of 40 Gb/s optical transponders has been fabricated in 65 nm 12-metal CMOS. By demultiplexing to 16 × 2.5 Gb/s internally, all logic and testability functions could be implemented in standard-cell CMOS, resulting in total power consumption of 3 W, 75 % lower than commercial BiCMOS SFI5 40 Gb/s SerDes ICs. Chip area is 4 × 4 mm, and the ICs are flip-chip mounted into a quad flat-pack package.
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Analysis and design of a 1.8-GHz CMOS LC quadrature VCO
Pietro Andreani, Andrea Bonfanti, L. Romano et al. · IEEE Journal of Solid-State Circuits · 2002 · 408 citations · Full text