IEEE Journal of Solid-State Circuits · 2001 · 62 citations · 9 references
EngineeringElectrical EngineeringMicroelectronicsOptoelectronicsSemiconductor DevicesClock Distribution NetworksClock ManagementDigital Integrated CircuitsIntegrated Circuit DesignMixed-signal Integrated Circuit DesignPhotodetectorsBit Error RateBit-error Rate AnalysisClock Data RecoveryHeterojunction Bipolar TransistorsOptical TransmissionOptical Transmission SystemsRobustnessSignal-to-noise Ratio
In this paper, a fully integrated 40-Gb/s clock and data recovery (CDR) IC with additional 1:4 demultiplexer (DEMUX) functionality is presented. The IC is implemented in a state-of-the-art production SiGe process. Its phase-locked-loop-based architecture with bang-bang-type phase detector (PD) provides maximum robustness. To the authors' best knowledge, it is the first 40-Gb/s CDR IC fabricated in a SiGe heterojunction bipolar technology (HBT). The measurement results demonstrate an input sensitivity of 42-mV single-ended data input swing at a bit-error rate (BER) of 10/sup -10/. As demonstrated in optical transmission experiments with the IC embedded in a 40-Gb/s link, the CDR/DEMUX shows complete functionality as a single-chip-receiver IC. A BER of 10/sup -10/ requires an optical signal-to-noise ratio of 23.3 dB.
9
Clock recovery from random binary signals
John Alexander · Electronics Letters · 1975 · 309 citations
Engineering, Computer Engineering, Electrical Engineering +16
SiGe base bipolar technology with 74 GHz f/sub max/ and 11 ps gate delay
T.F. Meister, H. Schäfer, M. Franosch et al. · 2002 · 69 citations
42 GHz static frequency divider in a Si/SiGe bipolar technology
M. Wurzer, T.F. Meister, Isabell Schäfer et al. · 2002 · 44 citations