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High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique

EngineeringElectron MicroscopyPhysicsMicroscopyMicrofabricationSpectroscopySurface ScienceApplied PhysicsMicroscopy MethodScanning Force MicroscopyScanning Probe MicroscopyContact Potential DifferenceElectron MicroscopeHigh Resolution ImagingMedicineBiophysics