A plasticity-based model of material removal in chemical-mechanical polishing (CMP)

Guanghui Fu, Abhijit Chandra, S. Guha, Ghatu Subhash

IEEE Transactions on Semiconductor Manufacturing · 2001 · 159 citations · 41 references

Concepts

TL;DR

The chemical reaction between an oxide layer and a water‑based slurry creates a softer hydroxylated interface that is assumed to deform plastically during CMP. The study models this hydroxylated interface as a perfectly plastic material and develops a mechanistic model for CMP material removal rate. The model treats the soft pad as a bending elastic beam, applies plasticity theory to predict MRR, and evaluates design parameters such as abrasive shape, size, concentration, and pad stiffness, with predictions benchmarked against glass polishing, lapping, and CMP experiments. The model demonstrates that MRR depends on pressure and relative velocity and can delineate the effects of pad and slurry properties.

Abstract

It is well known that the chemical reaction between an oxide layer and a water-based slurry produces a softer hydroxylated interface layer. During chemical-mechanical polishing (CMP), it is assumed that material removal occurs by the plastic deformation of this interface layer. In this paper, the behavior of the hydroxylated layer is modeled as a perfectly plastic, material, and a mechanistic model for material removal rate (MRR) in CMP is developed. The deformation profile of the soft pad is approximated as the bending of a thin elastic beam. In addition to the dependence of MRR on pressure and relative velocity, the proposed plasticity-based model is also capable of delineating the effects of pad and slurry properties. The plasticity-based model is utilized to explore the effects of various design parameters (e.g., abrasive shape, size and concentration, and pad stiffness) on the MRR. Model predictions are compared with existing experimental observations from glass polishing, lapping, and CMP.

References

41