IEEE Electron Device Letters · 1986 · 125 citations · 8 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesHigh-frequency Semiconductor DevicesMicrowave Integrated CircuitsMicrowave Noise AnalysisMicrowave Semiconductor DevicesNoise In Electronic DevicesNoise In Semiconductor DevicesGainLow-noise Microwave TransistorsMicrowave Noise CharacterizationMillimeter-wave TransistorsNoise Characteristics
We report excellent dc and millimeter-wave performance in In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.15</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.85</inf> As/Al <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.15</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.85</inf> As pseudomorphic modulation-doped field effect transistors (MODFET's) with 0.25-µm-length gates. Extrinsic transconductances as high as 495 mS/mm at 300 K and unprecedented power performance in the 60-GHz range were observed. Although not yet optimized, excellent low noise characteristics, 0.9 dB, with an associated gain of 10.4 dB at 18 GHz, and a noise figure of 2.4 dB with an associated gain of 4.4 dB at 62 GHz were obtained. This is the best noise performance ever reported for a MODFET in this frequency range. These results clearly demonstrate the superiority of pseudomorphic MODFET structures in high-frequency applications.
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Millimeter-wave low-noise high electron mobility transistors
P.C. Chao, S. C. Palmateer, P.M. Smith et al. · IEEE Electron Device Letters · 1985 · 56 citations