A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment

Abstract

A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts with adequate design margin and/or well behaved parts a generic elevated temperature irradiation test is proposed.