D. B. Brown

Surface plasmons at single nanoholes in Au films

Lijie Yin, V. K. Vlasko‐Vlasov, A. Rydh et al. · Applied Physics Letters · 2004 · 252 citations · Full text

Interface trap formation via the two-stage H/sup +/ process

N. S. Saks, D. B. Brown · IEEE Transactions on Nuclear Science · 1989 · 193 citations

Electrical Engineering, Ion Implantation, Engineering +15

Time dependence of radiation-induced interface trap formation in metal-oxide-semiconductor devices as a function of oxide thickness and applied field

D. B. Brown, N. S. Saks · Journal of Applied Physics · 1991 · 154 citations

Engineering, Applied Field, Nit Formation +16

An Evaluation of Low-Energy X-Ray and Cobalt-60 Irradiations of MOS Transistors

C. M. Dozier, Daniel M. Fleetwood, D. B. Brown et al. · IEEE Transactions on Nuclear Science · 1987 · 128 citations

Electrical Engineering, Voltage Shifts, Engineering +12

Time dependence of interface trap formation in MOSFETs following pulsed irradiation

N. S. Saks, C. M. Dozier, D. B. Brown · IEEE Transactions on Nuclear Science · 1988 · 127 citations

Electrical Engineering, Engineering, Radiation Generation +15