D. B. Brown - Concepedia

Author

D. B. Brown

United States Naval Research Laboratory ORCID

Also Known As

Brown, D, Brown, D. B., Brown, Danielle, D Brown, D. B. Brown, D. Brown, D.B. BROWN, D.B. Brown, Danielle Brown, Dennis Brown

Publications

2.7K

Citations

H-Index

Concepts

All Affiliations

United States Naval Research Laboratory Sandia National Laboratories

About

D. B. Brown is an author at United States Naval Research Laboratory specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	29	44	2.2K
2	Applied Physics	24	38	1.9K
3	Natural Sciences	10	10	304
4	Health Sciences	7	7	303
5	Medicine	5	5	116

D. B. Brown

Publications

2.5K

Citations

H-Index

Page 1

	Year	Citations
Surface plasmons at single nanoholes in Au films Lijie Yin, V. K. Vlasko‐Vlasov, A. Rydh, Applied Physics Letters	2004	252
Interface trap formation via the two-stage H/sup +/ process N. S. Saks, D. B. Brown IEEE Transactions on Nuclear Science Electrical EngineeringIon ImplantationEngineeringSemiconductor DevicePhysics	1989	193
Time dependence of radiation-induced interface trap formation in metal-oxide-semiconductor devices as a function of oxide thickness and applied field D. B. Brown, N. S. Saks Journal of Applied Physics EngineeringApplied FieldNit FormationSilicon On InsulatorSemiconductor Device	1991	154
An Evaluation of Low-Energy X-Ray and Cobalt-60 Irradiations of MOS Transistors C. M. Dozier, Daniel M. Fleetwood, D. B. Brown, IEEE Transactions on Nuclear Science Electrical EngineeringVoltage ShiftsEngineeringPhysicsRadiation Generation	1987	128
Time dependence of interface trap formation in MOSFETs following pulsed irradiation N. S. Saks, C. M. Dozier, D. B. Brown IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringRadiation GenerationPhysicsStress-induced Leakage Current	1988	127
Study of low-dose-rate radiation effects on commercial linear bipolar ICs R.K. Freitag, D. B. Brown IEEE Transactions on Nuclear Science Electrical EngineeringBipolar DevicesEngineeringHardware ReliabilityBias Temperature Instability	1998	94
Observation of H/sup +/ motion during interface trap formation N. S. Saks, D. B. Brown IEEE Transactions on Nuclear Science Ion ImplantationEngineeringPhysicsSurface ScienceApplied Physics	1990	92
A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment R.L. Pease, Lewis M. Cohn, Daniel M. Fleetwood, IEEE Transactions on Nuclear Science EngineeringElectromagnetic CompatibilityRadiation ProtectionLot Acceptance TestBipolar Linear Circuits	1997	81
Effect of Photon Energy on the Response of MOS Devices C. M. Dozier, D. B. Brown IEEE Transactions on Nuclear Science Photonic DevicePhotonicsElectrical EngineeringKev Incident PhotonsVoltage Shifts	1981	77
Comparison of enhanced device response and predicted X-ray dose enhancement effects on MOS oxides Daniel M. Fleetwood, D.E. Beutler, L.J. Lorence, IEEE Transactions on Nuclear Science X-ray SpectroscopyEngineeringMos OxidesMos CapacitorsSemiconductor Device	1988	77

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