Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy - Concepedia

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Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy

21

Citations

16

References

1998

Year

Honggu Im, B. Kaczer, J. P. Pelz, Sukit Limpijumnong, Walter R. L. Lambrecht, W. J. Choyke

Journal of Electronic Materials

Materials ScienceEngineeringNanotechnologyNanometer-scale InvestigationSurface ScienceApplied PhysicsScanning Probe MicroscopyNanometrologyNanoscale ScienceCarbide

References

	Year	Citations

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