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Gallium Nitride Nanorods Fabricated by Inductively Coupled Plasma Reactive Ion Etching
69
Citations
6
References
2002
Year
Materials ScienceWide-bandgap SemiconductorElectrical EngineeringEngineeringNanoelectronicsNanotechnologyGan NanorodsApplied PhysicsGallium Nitride NanorodsAluminum Gallium NitrideGan Power DeviceGallium OxideNanofabricationPlasma EtchingCategoryiii-v SemiconductorGallium NitridePlasma Reactive Ion
We report a novel method of fabricating gallium nitride (GaN) nanorods of controllable dimension and density from GaN epitaxial film using inductively coupled plasma reactive ion etching (ICP-RIE). The GaN epitaxial film was grown on a sapphire substrate by metal-organic chemical vapor deposition. Under the fixed Cl2/Ar flow rate of 10/25 sccm and ICP/bias power of 200/200 W, the GaN nanorods and array were fabricated with a density of 108–1010 cm-2 and dimension of 20–100 nm by varying the chamber pressure from 10 to 30 mTorr. The technique offers one-step, controllable method for the fabrication of GaN nanostructures and should be applicable for the fabrication of GaN-based nano-optoelectronic devices.
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