Morphology of SiSiO2 interface

The Si/SiO2 interface examined by cross-sectional transmission electron microscopy

Juliette Blanc, C. J. Buiocchi, M. S. Abrahams et al. · Applied Physics Letters · 1977 · 56 citations

Engineering, Materials Science, Physics +17

Effect of Thin Oxide Film on Breakdown Voltage of Silicon<i>N</i>⁺<i>P</i>Junction

Kazushige Matsumoto, Yuichi Haneta · Japanese Journal of Applied Physics · 1974 · 47 citations

Engineering, Electrical Engineering, Materials Science +14

Auger depth profiling of interfaces in MOS and MNOS structures

J. S. Johannessen, W. E. Spicer, Y. E. Strausser · Journal of Vacuum Science and Technology · 1976 · 41 citations

Engineering, Materials Engineering, Materials Science +14