Concepedia

XPS, Auger study of Cu3Si and its reaction with oxygen

W. F. Banholzer, Michael C. Burrell

Surface Science · 1986 · 68 citations · 18 references

DOI

Concepts

References

18

XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies

M. T. Anthony, M. P. Seah · Surface and Interface Analysis · 1984 · 290 citations

, , +15

The crystal structure of η-Cu<sub>3</sub>Si precipitates in silicon

Jan Ketil Solberg · Acta Crystallographica Section A · 1978 · 194 citations

, , +17

Application of Auger electron spectroscopy to studies of the silicon/silicide interface

J. A. Roth, C.R. Crowell · Journal of Vacuum Science and Technology · 1978 · 126 citations

, , +17

On the Mechanism of the Reaction between Methyl Chloride and Silicon-Copper

Dallas T. Hurd, Eugene G. Rochow · Journal of the American Chemical Society · 1945 · 85 citations

, , +5

Formation and properties of the copper silicon(111) interface

F. Ringeisen, J. Derrien, E. Daugy et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1983 · 67 citations

, , +17